NXP: Semiconductors Test and Characterization


Qplox dessigns advanced test and characterization systems for the last generation of NXP CMOS devices. Our systems are designed for Reliability, Calibration and Characterization of advanced CMOS integrated devices. Our test systems are used by NXP engineers and scientists. The technology used includes advanced electronic instrumentation, including PXI systems, SMU’s, Mass FLow Controlers, Environmental chambers, Sensors, Waveform Generators… We use different communication protocols, GPIB, I2C, SPI, Serial, SCPI…  Qplox dessigns dedicated PCB’s for test, characterization and calibration. Qplox and NXP for tomorrow’s IC world.

IMEC: Biosensors Characterization


Qplox provides IMEC with advanced technolgy developement in order to allow efficient characterization of some of their very innovative electronic biosensors. Qplox uses PXI technolgy to drive powerful multiplexing cards, coupled with a very accurate potentiostat. This solution provides the mix of accuracy, flexibility and throughput required by IMEC scientists.

Grammer: End of Line Test of Automotive Electronic Products


Qplox dessigns end of line automated test systems (ATE) to garanty the highest quality in assembled and delivered products. Grammer, world leader in off road vehicles interiors counts on Qplox for the end of line test and traceability of automotive controllers, sensors, joysticks, button clusters… We use a braod range of technologies, PXI, NI data adquisition cards, RFID chips, Image recognition systems, microntrollers… Qplox deliver the quality expected by the high standards of a world leader.

Melexis, characterization and test system automation for LED driver



Test and characterization system for A Web graphical user interface (GUI) server and a process controlling the operation of a high temperature operating life test-set (HTOL) for a novel LED RGB driver IC product aiming the high-end automotive LED-illumination market.

Semiconductor characterization

We integrated an Organic LED characterization system for OLED R&D production testing. For this purpose, we designed and fabricated a sample-holder stack hosting up to nine conventional glass samples. Each glass sample has up to 12 organic LED array areas. A contact array in the sample-holder stack allows connecting the sample to a Keithley ™ SMU by means of a switching matrix and perform JVL characterization on monochromatic, bicolor or tricolor leds. Luminance and Spectral radiance are measured using a Konica Minolta™  Radiometer. The sample holder is stepped in front of the camera using a three axis IAI Modbus positioner along the 108 leds. All instruments are computer controlled.

We created a software with a graphical user interface (GUI) with three focus areas. One area enables the definition of the measured sites, another allows defining a single sweep over all used leds to detect functionality. A third focus area allows performing a full sweep characterization including spectral response. Data are displayed in tree form along the IV and spectral response graphics. The software allows top and bottom emission measured by rotating the sample-holder and the storage and recall of different combinations of sample stepping-layout and OLED emission-type.